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Accelerating Surface Composition Characterization of Thin-Film Materials Libraries using Multi-Output Gaussian Process Regression

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Thelen, F., Lourens, F., Ludwig, A.
Formato:	Preprint
Publicado:	2025
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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