Čechal, J., & Procházka, P. (2025). Low-energy electron microscopy as a tool for analysis of self-assembled molecular layers on surfaces.
Chicago Style (17th ed.) CitationČechal, Jan, and Pavel Procházka. Low-energy Electron Microscopy as a Tool for Analysis of Self-assembled Molecular Layers on Surfaces. 2025.
MLA (9th ed.) CitationČechal, Jan, and Pavel Procházka. Low-energy Electron Microscopy as a Tool for Analysis of Self-assembled Molecular Layers on Surfaces. 2025.
Warning: These citations may not always be 100% accurate.