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Low-energy electron microscopy as a tool for analysis of self-assembled molecular layers on surfaces

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Čechal, Jan, Procházka, Pavel
Formato:	Preprint
Publicado:	2025
Materias:	Mesoscale and Nanoscale Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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