Can Test-Time Scaling Improve World Foundation Model?

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cong, Wenyan, Zhu, Hanqing, Wang, Peihao, Liu, Bangya, Xu, Dejia, Wang, Kevin, Pan, David Z., Wang, Yan, Fan, Zhiwen, Wang, Zhangyang
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2503.24320