Ultrafast Spontaneous Exciton Dissociation via Phonon Emission in BiVO$_4$

Fuente: arXiv
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Hauptverfasser: Gant, Stephen E., Alvertis, Antonios M., Coveney, Christopher J. N., Haber, Jonah B., Filip, Marina R., Neaton, Jeffrey B.
Format: Preprint
Veröffentlicht: 2025
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author Gant, Stephen E.
Alvertis, Antonios M.
Coveney, Christopher J. N.
Haber, Jonah B.
Filip, Marina R.
Neaton, Jeffrey B.
author_facet Gant, Stephen E.
Alvertis, Antonios M.
Coveney, Christopher J. N.
Haber, Jonah B.
Filip, Marina R.
Neaton, Jeffrey B.
contents Monoclinic bismuth vanadate (m-BiVO$_4$) is a promising indirect band gap semiconductor for photoelectrochemical water splitting, yet the characteristics of its low-lying photoexcitations, or excitons, remain poorly understood. Here, we use an ab initio Bethe-Salpeter equation approach that incorporates phonon screening to compute the nature and lifetimes of the low-lying excitons of m-BiVO$_4$. Our calculations indicate that at 0 K, the lowest-lying exciton energy exceeds the indirect band gap, enabling spontaneous dissociation into free carriers via phonon emission within picoseconds. At 300 K, both phonon emission and absorption effects reduce this timescale to only a few femtoseconds. Phonon screening also greatly reduces the binding energy of the lowest-lying exciton, leading to an optical absorption spectrum that better reproduces experimental measurements. Overall, our findings establish the general conditions under which phonon emission-driven exciton dissociation can occur in indirect gap semiconductors, and they emphasize the critical role phonon screening can play in predictive calculations of photophysical properties of complex materials.
format Preprint
id arxiv_https___arxiv_org_abs_2504_00110
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Ultrafast Spontaneous Exciton Dissociation via Phonon Emission in BiVO$_4$
Gant, Stephen E.
Alvertis, Antonios M.
Coveney, Christopher J. N.
Haber, Jonah B.
Filip, Marina R.
Neaton, Jeffrey B.
Materials Science
Monoclinic bismuth vanadate (m-BiVO$_4$) is a promising indirect band gap semiconductor for photoelectrochemical water splitting, yet the characteristics of its low-lying photoexcitations, or excitons, remain poorly understood. Here, we use an ab initio Bethe-Salpeter equation approach that incorporates phonon screening to compute the nature and lifetimes of the low-lying excitons of m-BiVO$_4$. Our calculations indicate that at 0 K, the lowest-lying exciton energy exceeds the indirect band gap, enabling spontaneous dissociation into free carriers via phonon emission within picoseconds. At 300 K, both phonon emission and absorption effects reduce this timescale to only a few femtoseconds. Phonon screening also greatly reduces the binding energy of the lowest-lying exciton, leading to an optical absorption spectrum that better reproduces experimental measurements. Overall, our findings establish the general conditions under which phonon emission-driven exciton dissociation can occur in indirect gap semiconductors, and they emphasize the critical role phonon screening can play in predictive calculations of photophysical properties of complex materials.
title Ultrafast Spontaneous Exciton Dissociation via Phonon Emission in BiVO$_4$
topic Materials Science
url https://arxiv.org/abs/2504.00110