NeRF-Based defect detection
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arXiv
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| Main Authors: | , , , , , , , , |
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| Format: | Preprint |
| Published: |
2025
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| _version_ | 1866915221045510144 |
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| author | Tianqi Ding Xiang, Dawei Qi, Yijiashun Yang, Ze Zhao, Zunduo Sun, Tianyao Feng, Pengbin Wang, Haoyu |
| author_facet | Tianqi Ding Xiang, Dawei Qi, Yijiashun Yang, Ze Zhao, Zunduo Sun, Tianyao Feng, Pengbin Wang, Haoyu |
| contents | The rapid growth of industrial automation has highlighted the need for precise and efficient defect detection in large-scale machinery. Traditional inspection techniques, involving manual procedures such as scaling tall structures for visual evaluation, are labor-intensive, subjective, and often hazardous. To overcome these challenges, this paper introduces an automated defect detection framework built on Neural Radiance Fields (NeRF) and the concept of digital twins. The system utilizes UAVs to capture images and reconstruct 3D models of machinery, producing both a standard reference model and a current-state model for comparison. Alignment of the models is achieved through the Iterative Closest Point (ICP) algorithm, enabling precise point cloud analysis to detect deviations that signify potential defects. By eliminating manual inspection, this method improves accuracy, enhances operational safety, and offers a scalable solution for defect detection. The proposed approach demonstrates great promise for reliable and efficient industrial applications. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2504_00270 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | NeRF-Based defect detection Tianqi Ding Xiang, Dawei Qi, Yijiashun Yang, Ze Zhao, Zunduo Sun, Tianyao Feng, Pengbin Wang, Haoyu Computer Vision and Pattern Recognition The rapid growth of industrial automation has highlighted the need for precise and efficient defect detection in large-scale machinery. Traditional inspection techniques, involving manual procedures such as scaling tall structures for visual evaluation, are labor-intensive, subjective, and often hazardous. To overcome these challenges, this paper introduces an automated defect detection framework built on Neural Radiance Fields (NeRF) and the concept of digital twins. The system utilizes UAVs to capture images and reconstruct 3D models of machinery, producing both a standard reference model and a current-state model for comparison. Alignment of the models is achieved through the Iterative Closest Point (ICP) algorithm, enabling precise point cloud analysis to detect deviations that signify potential defects. By eliminating manual inspection, this method improves accuracy, enhances operational safety, and offers a scalable solution for defect detection. The proposed approach demonstrates great promise for reliable and efficient industrial applications. |
| title | NeRF-Based defect detection |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2504.00270 |