Cita APA (7a ed.)

Mohammad, F., & Ryu, D. (2025). Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers.

Cita Chicago Style (17a ed.)

Mohammad, Faisal, y Duksan Ryu. Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers. 2025.

Cita MLA (9a ed.)

Mohammad, Faisal, y Duksan Ryu. Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers. 2025.