Inferring scattering-type Scanning Near-Field Optical Microscopy Data from Atomic Force Microscopy Images

Fuente: arXiv

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Bibliographic Details
Main Authors:	Stanciu, Stefan G., Anton, Stefan R., Tranca, Denis E., Stanciu, George A., Ionescu, Bogdan, Zalevsky, Zeev, Kusnetz, Binyamin, Belhassen, Jeremy, Karsenty, Avi, Cincotti, Gabriella
Format:	Preprint
Published:	2025
Subjects:	Optics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2504.02982