SDEIT: Semantic-Driven Electrical Impedance Tomography

Fuente: arXiv

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Bibliographic Details
Main Authors:	Liu, Dong, Wu, Yuanchao, Tong, Bowen, Deng, Jiansong
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2504.04185