Masked Scene Modeling: Narrowing the Gap Between Supervised and Self-Supervised Learning in 3D Scene Understanding
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| Format: | Preprint |
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2025
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| _version_ | 1866910907330723840 |
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| author | Hermosilla, Pedro Stippel, Christian Sick, Leon |
| author_facet | Hermosilla, Pedro Stippel, Christian Sick, Leon |
| contents | Self-supervised learning has transformed 2D computer vision by enabling models trained on large, unannotated datasets to provide versatile off-the-shelf features that perform similarly to models trained with labels. However, in 3D scene understanding, self-supervised methods are typically only used as a weight initialization step for task-specific fine-tuning, limiting their utility for general-purpose feature extraction. This paper addresses this shortcoming by proposing a robust evaluation protocol specifically designed to assess the quality of self-supervised features for 3D scene understanding. Our protocol uses multi-resolution feature sampling of hierarchical models to create rich point-level representations that capture the semantic capabilities of the model and, hence, are suitable for evaluation with linear probing and nearest-neighbor methods. Furthermore, we introduce the first self-supervised model that performs similarly to supervised models when only off-the-shelf features are used in a linear probing setup. In particular, our model is trained natively in 3D with a novel self-supervised approach based on a Masked Scene Modeling objective, which reconstructs deep features of masked patches in a bottom-up manner and is specifically tailored to hierarchical 3D models. Our experiments not only demonstrate that our method achieves competitive performance to supervised models, but also surpasses existing self-supervised approaches by a large margin. The model and training code can be found at our Github repository (https://github.com/phermosilla/msm). |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2504_06719 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Masked Scene Modeling: Narrowing the Gap Between Supervised and Self-Supervised Learning in 3D Scene Understanding Hermosilla, Pedro Stippel, Christian Sick, Leon Computer Vision and Pattern Recognition Artificial Intelligence Self-supervised learning has transformed 2D computer vision by enabling models trained on large, unannotated datasets to provide versatile off-the-shelf features that perform similarly to models trained with labels. However, in 3D scene understanding, self-supervised methods are typically only used as a weight initialization step for task-specific fine-tuning, limiting their utility for general-purpose feature extraction. This paper addresses this shortcoming by proposing a robust evaluation protocol specifically designed to assess the quality of self-supervised features for 3D scene understanding. Our protocol uses multi-resolution feature sampling of hierarchical models to create rich point-level representations that capture the semantic capabilities of the model and, hence, are suitable for evaluation with linear probing and nearest-neighbor methods. Furthermore, we introduce the first self-supervised model that performs similarly to supervised models when only off-the-shelf features are used in a linear probing setup. In particular, our model is trained natively in 3D with a novel self-supervised approach based on a Masked Scene Modeling objective, which reconstructs deep features of masked patches in a bottom-up manner and is specifically tailored to hierarchical 3D models. Our experiments not only demonstrate that our method achieves competitive performance to supervised models, but also surpasses existing self-supervised approaches by a large margin. The model and training code can be found at our Github repository (https://github.com/phermosilla/msm). |
| title | Masked Scene Modeling: Narrowing the Gap Between Supervised and Self-Supervised Learning in 3D Scene Understanding |
| topic | Computer Vision and Pattern Recognition Artificial Intelligence |
| url | https://arxiv.org/abs/2504.06719 |