Just TestIt! An SBST Approach To Automate System-Integration Testing

Fuente: arXiv
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Auteurs principaux: Terzano, Tommaso, Giuffrida, Luigi, Sapriza, Juan, Schiavone, Pasquale Davide, Masera, Guido, Atienza, David, Lavagno, Luciano, Martina, Maurizio
Format: Preprint
Publié: 2025
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author Terzano, Tommaso
Giuffrida, Luigi
Sapriza, Juan
Schiavone, Pasquale Davide
Masera, Guido
Atienza, David
Lavagno, Luciano
Martina, Maurizio
author_facet Terzano, Tommaso
Giuffrida, Luigi
Sapriza, Juan
Schiavone, Pasquale Davide
Masera, Guido
Atienza, David
Lavagno, Luciano
Martina, Maurizio
contents This paper introduces TestIt, an open-source Python package designed to automate full-system integration testing using a Software-Based Self-Test (SBST) approach. By dynamically generating test vectors and golden references, TestIt significantly reduces development time and complexity while supporting both simulation and FPGA environments. Its flexible design positions TestIt as a key enabler for the widespread adoption of CI/CD methodologies in open-source RTL development. A case study on the X-HEEP RISC-V microcontroller (MCU), which integrates a custom accelerator, showcases TestIt's ability to detect hardware and software faults that traditional formal methods may overlook. Furthermore, the case study highlights how TestIt can be leveraged to characterize system performance with minimal effort. By automating testing on the PYNQ-Z2 FPGA development board, we achieved a 11x speed-up with respect to RTL simulations.
format Preprint
id arxiv_https___arxiv_org_abs_2504_07555
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Just TestIt! An SBST Approach To Automate System-Integration Testing
Terzano, Tommaso
Giuffrida, Luigi
Sapriza, Juan
Schiavone, Pasquale Davide
Masera, Guido
Atienza, David
Lavagno, Luciano
Martina, Maurizio
Hardware Architecture
This paper introduces TestIt, an open-source Python package designed to automate full-system integration testing using a Software-Based Self-Test (SBST) approach. By dynamically generating test vectors and golden references, TestIt significantly reduces development time and complexity while supporting both simulation and FPGA environments. Its flexible design positions TestIt as a key enabler for the widespread adoption of CI/CD methodologies in open-source RTL development. A case study on the X-HEEP RISC-V microcontroller (MCU), which integrates a custom accelerator, showcases TestIt's ability to detect hardware and software faults that traditional formal methods may overlook. Furthermore, the case study highlights how TestIt can be leveraged to characterize system performance with minimal effort. By automating testing on the PYNQ-Z2 FPGA development board, we achieved a 11x speed-up with respect to RTL simulations.
title Just TestIt! An SBST Approach To Automate System-Integration Testing
topic Hardware Architecture
url https://arxiv.org/abs/2504.07555