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Unraveling the dynamics of conductive filaments in MoS${_2}$ based memristors by operando transmission electron microscopy

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Ran, Ke, Jo, Janghyun, Cruces, Sofía, Wang, Zhenxing, Dunin-Borkowski, Rafal E., Mayer, Joachim, Lemme, Max C.
Format:	Preprint
Publié:	2025
Sujets:	Materials Science Applied Physics
Accès en ligne:	Acceder al recurso
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