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A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement

Fuente: arXiv

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Bibliographic Details
Main Authors:	Gomi, Yuibi, Sato, Akira, Madany, Waleed, Okada, Kenichi, Adachi, Satoshi, Itoh, Masatoshi, Hashimoto, Masanori
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors Hardware Architecture
Online Access:	Acceder al recurso
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