Gespeichert in:
| Hauptverfasser: | , , , , , , , , , , , |
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| Format: | Preprint |
| Veröffentlicht: |
2025
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| Schlagworte: | |
| Online-Zugang: | https://arxiv.org/abs/2504.09937 |
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Inhaltsangabe:
- Accurate, non-contact temperature measurement with high spatial resolution is essential for understanding thermal behavior in integrated nanoscale devices and heterogeneous interfaces. However, existing techniques are often limited by the need for physical contact or insufficient spatial resolution for the measurement of local temperature and mapping its distribution. Here, we showcase the direct temperature measurement of graphene with nanometer spatial resolution in transmission electron microscopy. In experiments, combining a scanning nanobeam with precession electron diffraction offers the collection of kinemetic diffraction from a local area at the nanometer scale. In analysis, we use a pre-calculated, sample-specific structure-factor-based correction method to enable the linear fitting of the diffraction intensities, allowing the determination of the Debye-Waller factor as a function of temperature at the precision of 10-4Å2/°C. With the high spatial resolution and measurement precision, the temperature and thermal vibration mapping further reveal the influence of graphene lattice parameters and thickness on the Debye-Waller factor, providing valuable insights into the vibrational properties impacted by temperature, lattice structure, and graphene layer thickness.