Röhrich, N., Hoffmann, A., Nordsieck, R., Zarbali, E., & Javanmardi, A. (2025). Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics.
Citazione stile Chigago Style (17a edizione)Röhrich, Nikolai, Alwin Hoffmann, Richard Nordsieck, Emilio Zarbali, e Alireza Javanmardi. Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics. 2025.
Citatione MLA (9a ed.)Röhrich, Nikolai, et al. Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics. 2025.
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