Röhrich, N., Hoffmann, A., Nordsieck, R., Zarbali, E., & Javanmardi, A. (2025). Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics.
Chicago Style (17th ed.) CitationRöhrich, Nikolai, Alwin Hoffmann, Richard Nordsieck, Emilio Zarbali, and Alireza Javanmardi. Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics. 2025.
MLA (9th ed.) CitationRöhrich, Nikolai, et al. Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics. 2025.
Warning: These citations may not always be 100% accurate.