Design Optimization of Flip FET Standard Cells with Dual-sided Pins for Ultimate Scaling

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Gui, Rui, Lu, Haoran, Sun, Jiacheng, Jiang, Xun, Zhang, Lining, Li, Ming, Lin, Yibo, Wang, Runsheng, Wu, Heng, Huang, Ru
Format:	Preprint
Published:	2025
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2504.10122