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Design Optimization of Flip FET Standard Cells with Dual-sided Pins for Ultimate Scaling

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Gui, Rui, Lu, Haoran, Sun, Jiacheng, Jiang, Xun, Zhang, Lining, Li, Ming, Lin, Yibo, Wang, Runsheng, Wu, Heng, Huang, Ru
Formato:	Preprint
Publicado:	2025
Materias:	Mesoscale and Nanoscale Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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