Picogram-Level Nanoplastic Analysis with Nanoelectromechanical System Fourier Transform Infrared Spectroscopy: NEMS-FTIR

Fuente: arXiv

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Bibliographic Details
Main Authors:	Timarac-Popović, Jelena, Hiesberger, Johannes, Šesto, Eldira, Luhmann, Niklas, Giesriegl, Ariane, Bešić, Hajrudin, Lafleur, Josiane P., Schmid, Silvan
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors Applied Physics Atomic and Molecular Clusters Chemical Physics Optics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2504.10192