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| Main Authors: | , , , , , , , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2504.10238 |
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Table of Contents:
- A comprehensive spectroscopic characterisation of two highly hydrogenated monolayer graphene samples transferred onto nickel grids is reported. With X ray photoemission spectroscopy on the C 1s core-level, a 100$\%$ $sp^3$ profile was observed upon hydrogenation of a more $sp^3$-like initially defected graphene, while a flatter, more $sp^2$-arranged, graphene reached a 62$\%$ $sp^3$ saturation. Low-energy reflection electron energy-loss spectroscopy (EELS) corroborates these findings through the $π$-plasmon excitation quenching for the fully $sp^3$ sample and a significant reduction for the partially converted one. The extreme surface sensitivity of low-energy reflection EELS enables extraction of the optical band gap of the hydrogenated layer even on a metallic support, yielding values of 6.3 and 6.2 eV for the two samples. The C--H stretching vibrational mode is also resolved, providing a direct fingerprint of graphene--hydrogen bonding. Finally, valence-band measurements of the $62\%$ saturated sample suggest the coexistence of one-sided and two-sided hydrogenation morphologies.