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Practical considerations for crystallographic and microstructure mapping with direct electron detector-based electron backscatter diffraction

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Tianbi, Birch, Ruth, Francolini, Graeme, Uluscu, Ebru Karakurt, Britton, Ben
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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