Full Crystallographic Imaging of Hexagonal Boron Nitride Monolayers with Phonon-Enhanced Sum-Frequency Microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Mueller, Niclas S., Fellows, Alexander P., John, Ben, Naclerio, Andrew E., Carbogno, Christian, Gharagozloo-Hubmann, Katayoun, Baláž, Damián, Kowalski, Ryan A., Heenen, Hendrik H., Scheurer, Christoph, Reuter, Karsten, Caldwell, Joshua D., Wolf, Martin, Kidambi, Piran R., Thämer, Martin, Paarmann, Alexander
Format:	Preprint
Published:	2025
Subjects:	Materials Science Mesoscale and Nanoscale Physics Optics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2504.15939