Wafer-Scale Characterization of Al/AlxOy/Al Josephson Junctions at Room Temperature

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lang, Simon J. K., Eisele, Ignaz, Weber, Johannes, Schewski, Alexandra, Music, Emir, Maiwald, Alwin, Heigl, Martin, Zahn, Daniela, Luo, Zhen, Nebrich, Lars, Schoof, Benedikt, Mayer, Thomas, Sturm-Rogon, Leonhard, Lerch, Wilfried, Pereira, Rui N., Kutter, Christoph
Format:	Preprint
Published:	2025
Subjects:	Quantum Physics Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2504.16686