Systemic Flakiness: An Empirical Analysis of Co-Occurring Flaky Test Failures

Fuente: arXiv

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Bibliographic Details
Main Authors:	Parry, Owain, Kapfhammer, Gregory, Hilton, Michael, McMinn, Phil
Format:	Preprint
Published:	2025
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2504.16777