Enhanced Sample Selection with Confidence Tracking: Identifying Correctly Labeled yet Hard-to-Learn Samples in Noisy Data

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pan, Weiran, Wei, Wei, Zhu, Feida, Deng, Yong
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2504.17474