Copper-impurity-free photonic integrated circuits enable deterministic soliton microcombs
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| Main Authors: | , , , , , , , |
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| Format: | Preprint |
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2025
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| _version_ | 1866908613433360384 |
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| author | Ji, Xinru Li, Xurong Qiu, Zheru Wang, Rui Ning Divall, Marta Gelash, Andrey Lihachev, Grigory Kippenberg, Tobias J. |
| author_facet | Ji, Xinru Li, Xurong Qiu, Zheru Wang, Rui Ning Divall, Marta Gelash, Andrey Lihachev, Grigory Kippenberg, Tobias J. |
| contents | Chip-scale optical frequency combs based on microresonators (microcombs) enable GHz-THz repetition rates, broad bandwidth, compactness, and compatibility with wafer-scale manufacturing. Silicon nitride photonic integrated circuits have become a leading platform due to their low loss, broad transparency, lithographic dispersion control, and commercial 200-mm-wafer foundry access. They have enabled system-level applications in optical communications, LiDAR, frequency synthesis, low-noise microwave generation, and convolutional processing. However, real-world deployment is hindered by the challenge of deterministic soliton microcomb generation, primarily due to thermal instabilities. Although techniques like pulsed pumping, fast scanning, and auxiliary lasers help mitigate these effects, they often add complexity or reduce soliton stability. In this work, we overcome thermal limitations and demonstrate deterministic soliton generation in silicon nitride photonic circuits. We trace the thermal effects to copper impurities within waveguides, originating from residual contaminants in CMOS-grade silicon wafers that are gettered into silicon nitride during fabrication. By developing effective copper removal techniques, we significantly reduce thermal instabilities. This enables soliton generation with arbitrary or slow laser scanning, removing a key barrier to microcomb deployment. Our approach is compatible with front-end-of-line foundry processing, paving the way for broader adoption of soliton microcomb technologies. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2504_18195 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Copper-impurity-free photonic integrated circuits enable deterministic soliton microcombs Ji, Xinru Li, Xurong Qiu, Zheru Wang, Rui Ning Divall, Marta Gelash, Andrey Lihachev, Grigory Kippenberg, Tobias J. Optics Applied Physics Chip-scale optical frequency combs based on microresonators (microcombs) enable GHz-THz repetition rates, broad bandwidth, compactness, and compatibility with wafer-scale manufacturing. Silicon nitride photonic integrated circuits have become a leading platform due to their low loss, broad transparency, lithographic dispersion control, and commercial 200-mm-wafer foundry access. They have enabled system-level applications in optical communications, LiDAR, frequency synthesis, low-noise microwave generation, and convolutional processing. However, real-world deployment is hindered by the challenge of deterministic soliton microcomb generation, primarily due to thermal instabilities. Although techniques like pulsed pumping, fast scanning, and auxiliary lasers help mitigate these effects, they often add complexity or reduce soliton stability. In this work, we overcome thermal limitations and demonstrate deterministic soliton generation in silicon nitride photonic circuits. We trace the thermal effects to copper impurities within waveguides, originating from residual contaminants in CMOS-grade silicon wafers that are gettered into silicon nitride during fabrication. By developing effective copper removal techniques, we significantly reduce thermal instabilities. This enables soliton generation with arbitrary or slow laser scanning, removing a key barrier to microcomb deployment. Our approach is compatible with front-end-of-line foundry processing, paving the way for broader adoption of soliton microcomb technologies. |
| title | Copper-impurity-free photonic integrated circuits enable deterministic soliton microcombs |
| topic | Optics Applied Physics |
| url | https://arxiv.org/abs/2504.18195 |