Co-Change Graph Entropy: A New Process Metric for Defect Prediction

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hrishikesh, Ethari, Kumar, Amit, Bhardwaj, Meher, Agarwal, Sonali
Format:	Preprint
Published:	2025
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2504.18511