Synchrotron light source focused X-ray detection with LGADs, AC-LGADs and TI-LGADs
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| Main Authors: | , , , , , , , , , , , , , , , |
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| Format: | Preprint |
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2025
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| author | Molnar, A. Zhao, Y. Mazza, S. M. Oregan, G. Davis, M. Beringer, S. Tiernan, A. Ott, J. Sadrozinski, H. F. -W. Seiden, A. Schumm, B. McKinney-Martinez, F. Bisht, A. Centis-Vignali, M. Paternoster, G. Boscardin, M. |
| author_facet | Molnar, A. Zhao, Y. Mazza, S. M. Oregan, G. Davis, M. Beringer, S. Tiernan, A. Ott, J. Sadrozinski, H. F. -W. Seiden, A. Schumm, B. McKinney-Martinez, F. Bisht, A. Centis-Vignali, M. Paternoster, G. Boscardin, M. |
| contents | The response of Low Gain Avalanche Diodes (LGADs), a type of thin silicon detector with internal gain, to X-rays of energies between 6-16~keV was characterized at the Stanford Synchrotron Radiation Lightsource (SSRL). The utilized beamline at SSRL was 7-2, with a nominal beam size of 30~$μ$m, repetition rate of 500~MHz, and with an energy dispersion $ΔE/E$ of $10^{-4}$. Multi-channel LGADs, AC-LGADs, and TI-LGADs of different thicknesses and gain layer configurations from Hamamatsu Photonics (HPK) and Fondazione Bruno Kessler (FBK) were tested. The sensors were read out with a discrete component board and digitized with a fast oscilloscope or a CAEN fast digitizer. The devices' energy response, energy resolution, and time resolution were measured as a function of X-ray energy and position. The charge collection and multiplication mechanism were simulated using TCAD Sentaurus, and the results were compared with the collected data. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2504_18638 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Synchrotron light source focused X-ray detection with LGADs, AC-LGADs and TI-LGADs Molnar, A. Zhao, Y. Mazza, S. M. Oregan, G. Davis, M. Beringer, S. Tiernan, A. Ott, J. Sadrozinski, H. F. -W. Seiden, A. Schumm, B. McKinney-Martinez, F. Bisht, A. Centis-Vignali, M. Paternoster, G. Boscardin, M. Instrumentation and Detectors High Energy Physics - Experiment The response of Low Gain Avalanche Diodes (LGADs), a type of thin silicon detector with internal gain, to X-rays of energies between 6-16~keV was characterized at the Stanford Synchrotron Radiation Lightsource (SSRL). The utilized beamline at SSRL was 7-2, with a nominal beam size of 30~$μ$m, repetition rate of 500~MHz, and with an energy dispersion $ΔE/E$ of $10^{-4}$. Multi-channel LGADs, AC-LGADs, and TI-LGADs of different thicknesses and gain layer configurations from Hamamatsu Photonics (HPK) and Fondazione Bruno Kessler (FBK) were tested. The sensors were read out with a discrete component board and digitized with a fast oscilloscope or a CAEN fast digitizer. The devices' energy response, energy resolution, and time resolution were measured as a function of X-ray energy and position. The charge collection and multiplication mechanism were simulated using TCAD Sentaurus, and the results were compared with the collected data. |
| title | Synchrotron light source focused X-ray detection with LGADs, AC-LGADs and TI-LGADs |
| topic | Instrumentation and Detectors High Energy Physics - Experiment |
| url | https://arxiv.org/abs/2504.18638 |