In situ measurement of electrical resistivity evolution during dynamic compression of copper

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Yan, K., Wang, Zhaokun, Mei, Haijuan, Sun, Wanting
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items