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LR-IAD:Mask-Free Industrial Anomaly Detection with Logical Reasoning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zeng, Peijian, Pang, Feiyan, Wang, Zhanbo, Yang, Aimin
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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