From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Ye, Junhao, Hu, Yuchen, Xu, Ke, Pan, Dingrong, Chen, Qichun, Zhou, Jie, Zhao, Shuai, Fang, Xinwei, Wang, Xi, Guan, Nan, Jiang, Zhe
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866911570524635136
author Ye, Junhao
Hu, Yuchen
Xu, Ke
Pan, Dingrong
Chen, Qichun
Zhou, Jie
Zhao, Shuai
Fang, Xinwei
Wang, Xi
Guan, Nan
Jiang, Zhe
author_facet Ye, Junhao
Hu, Yuchen
Xu, Ke
Pan, Dingrong
Chen, Qichun
Zhou, Jie
Zhao, Shuai
Fang, Xinwei
Wang, Xi
Guan, Nan
Jiang, Zhe
contents Verification presents a major bottleneck in Integrated Circuit (IC) development, consuming nearly 70% of the total development effort. While the Universal Verification Methodology (UVM) is widely used in industry to improve verification efficiency through structured and reusable testbenches, constructing these testbenches and generating sufficient stimuli remain challenging. These challenges arise from the considerable manual coding effort required, repetitive manual execution of multiple EDA tools, and the need for in-depth domain expertise to navigate complex designs.Here, we present UVM^2, an automated verification framework that leverages Large Language Models (LLMs) to generate UVM testbenches and iteratively refine them using coverage feedback, significantly reducing manual effort while maintaining rigorous verification standards.To evaluate UVM^2, we introduce a benchmark suite comprising Register Transfer Level (RTL) designs of up to 1.6K lines of code.The results show that UVM^2 reduces testbench setup time by up to UVM^2 compared to experienced engineers, and achieve average code and function coverage of 87.44% and 89.58%, outperforming state-of-the-art solutions by 20.96% and 23.51%, respectively.
format Preprint
id arxiv_https___arxiv_org_abs_2504_19959
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification
Ye, Junhao
Hu, Yuchen
Xu, Ke
Pan, Dingrong
Chen, Qichun
Zhou, Jie
Zhao, Shuai
Fang, Xinwei
Wang, Xi
Guan, Nan
Jiang, Zhe
Hardware Architecture
Artificial Intelligence
Verification presents a major bottleneck in Integrated Circuit (IC) development, consuming nearly 70% of the total development effort. While the Universal Verification Methodology (UVM) is widely used in industry to improve verification efficiency through structured and reusable testbenches, constructing these testbenches and generating sufficient stimuli remain challenging. These challenges arise from the considerable manual coding effort required, repetitive manual execution of multiple EDA tools, and the need for in-depth domain expertise to navigate complex designs.Here, we present UVM^2, an automated verification framework that leverages Large Language Models (LLMs) to generate UVM testbenches and iteratively refine them using coverage feedback, significantly reducing manual effort while maintaining rigorous verification standards.To evaluate UVM^2, we introduce a benchmark suite comprising Register Transfer Level (RTL) designs of up to 1.6K lines of code.The results show that UVM^2 reduces testbench setup time by up to UVM^2 compared to experienced engineers, and achieve average code and function coverage of 87.44% and 89.58%, outperforming state-of-the-art solutions by 20.96% and 23.51%, respectively.
title From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification
topic Hardware Architecture
Artificial Intelligence
url https://arxiv.org/abs/2504.19959