On-chip calibrated radio-frequency measurement at cryogenic temperatures for determination of SrTiO3-based capacitor properties
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arXiv
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| Auteurs principaux: | , , , , , , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866909596688318464 |
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| author | Shirachi, Akitomi Shinozaki, Motoya Tomioka, Yasuhide Inoue, Hisashi Itoh, Kenta Kozuka, Yusuke Watanabe, Takanobu Sato, Shoichi Kumasaka, Takeshi Otsuka, Tomohiro |
| author_facet | Shirachi, Akitomi Shinozaki, Motoya Tomioka, Yasuhide Inoue, Hisashi Itoh, Kenta Kozuka, Yusuke Watanabe, Takanobu Sato, Shoichi Kumasaka, Takeshi Otsuka, Tomohiro |
| contents | Quantum computing has emerged as a promising technology for next-generation information processing, utilizing semiconductor quantum dots as one of the candidates for quantum bits. Radio-frequency (rf) reflectometry plays an important role in the readout of quantum dots but requires a precise rf measurement technique at cryogenic temperatures. While cryogenic calibration techniques, essential for rf reflectometry, have been developed, on-chip calibration near the device remains an important challenge. In this study, we develop an on-chip calibrated rf measurement system operating at 4K for characterizing SrTiO3-based varactors, which are promising components for tunable impedance matching circuits. Our system enables accurate measurements by eliminating errors associated with long rf circuit lines. We investigate the effects of annealing conditions, crystal orientation, and Ca doping of SrTiO3 crystals on the varactor properties in the frequency range for rf reflectometry. Our results provide insights for optimizing these components for cryogenic rf applications in quantum information processing systems. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2504_20311 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | On-chip calibrated radio-frequency measurement at cryogenic temperatures for determination of SrTiO3-based capacitor properties Shirachi, Akitomi Shinozaki, Motoya Tomioka, Yasuhide Inoue, Hisashi Itoh, Kenta Kozuka, Yusuke Watanabe, Takanobu Sato, Shoichi Kumasaka, Takeshi Otsuka, Tomohiro Mesoscale and Nanoscale Physics Quantum computing has emerged as a promising technology for next-generation information processing, utilizing semiconductor quantum dots as one of the candidates for quantum bits. Radio-frequency (rf) reflectometry plays an important role in the readout of quantum dots but requires a precise rf measurement technique at cryogenic temperatures. While cryogenic calibration techniques, essential for rf reflectometry, have been developed, on-chip calibration near the device remains an important challenge. In this study, we develop an on-chip calibrated rf measurement system operating at 4K for characterizing SrTiO3-based varactors, which are promising components for tunable impedance matching circuits. Our system enables accurate measurements by eliminating errors associated with long rf circuit lines. We investigate the effects of annealing conditions, crystal orientation, and Ca doping of SrTiO3 crystals on the varactor properties in the frequency range for rf reflectometry. Our results provide insights for optimizing these components for cryogenic rf applications in quantum information processing systems. |
| title | On-chip calibrated radio-frequency measurement at cryogenic temperatures for determination of SrTiO3-based capacitor properties |
| topic | Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2504.20311 |