STAMP-2.5D: Structural and Thermal Aware Methodology for Placement in 2.5D Integration

Fuente: arXiv
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Hauptverfasser: Parekh, Varun Darshana, Hazenstab, Zachary Wyatt, Srinivasa, Srivatsa Rangachar, Chakrabarty, Krishnendu, Ni, Kai, Narayanan, Vijaykrishnan
Format: Preprint
Veröffentlicht: 2025
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author Parekh, Varun Darshana
Hazenstab, Zachary Wyatt
Srinivasa, Srivatsa Rangachar
Chakrabarty, Krishnendu
Ni, Kai
Narayanan, Vijaykrishnan
author_facet Parekh, Varun Darshana
Hazenstab, Zachary Wyatt
Srinivasa, Srivatsa Rangachar
Chakrabarty, Krishnendu
Ni, Kai
Narayanan, Vijaykrishnan
contents Chiplet-based architectures and advanced packaging has emerged as transformative approaches in semiconductor design. While conventional physical design for 2.5D heterogeneous systems typically prioritizes wirelength reduction through tight chiplet packing, this strategy creates thermal bottlenecks and intensifies coefficient of thermal expansion (CTE) mismatches, compromising long-term reliability. Addressing these challenges requires holistic consideration of thermal performance, mechanical stress, and interconnect efficiency. We introduce STAMP-2.5D, the first automated floorplanning methodology that simultaneously optimizes these critical factors. Our approach employs finite element analysis to simulate temperature distributions and stress profiles across chiplet configurations while minimizing interconnect wirelength. Experimental results demonstrate that our thermal structural aware automated floorplanning approach reduces overall stress by 11% while maintaining excellent thermal performance with a negligible 0.5% temperature increase and simultaneously reducing total wirelength by 11% compared to temperature-only optimization. Additionally, we conduct an exploratory study on the effects of temperature gradients on structural integrity, providing crucial insights for reliability-conscious chiplet design. STAMP-2.5D establishes a robust platform for navigating critical trade-offs in advanced semiconductor packaging.
format Preprint
id arxiv_https___arxiv_org_abs_2504_21140
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle STAMP-2.5D: Structural and Thermal Aware Methodology for Placement in 2.5D Integration
Parekh, Varun Darshana
Hazenstab, Zachary Wyatt
Srinivasa, Srivatsa Rangachar
Chakrabarty, Krishnendu
Ni, Kai
Narayanan, Vijaykrishnan
Hardware Architecture
Emerging Technologies
Chiplet-based architectures and advanced packaging has emerged as transformative approaches in semiconductor design. While conventional physical design for 2.5D heterogeneous systems typically prioritizes wirelength reduction through tight chiplet packing, this strategy creates thermal bottlenecks and intensifies coefficient of thermal expansion (CTE) mismatches, compromising long-term reliability. Addressing these challenges requires holistic consideration of thermal performance, mechanical stress, and interconnect efficiency. We introduce STAMP-2.5D, the first automated floorplanning methodology that simultaneously optimizes these critical factors. Our approach employs finite element analysis to simulate temperature distributions and stress profiles across chiplet configurations while minimizing interconnect wirelength. Experimental results demonstrate that our thermal structural aware automated floorplanning approach reduces overall stress by 11% while maintaining excellent thermal performance with a negligible 0.5% temperature increase and simultaneously reducing total wirelength by 11% compared to temperature-only optimization. Additionally, we conduct an exploratory study on the effects of temperature gradients on structural integrity, providing crucial insights for reliability-conscious chiplet design. STAMP-2.5D establishes a robust platform for navigating critical trade-offs in advanced semiconductor packaging.
title STAMP-2.5D: Structural and Thermal Aware Methodology for Placement in 2.5D Integration
topic Hardware Architecture
Emerging Technologies
url https://arxiv.org/abs/2504.21140