Zhang, J. (2025). Enhanced semi-supervised stamping process monitoring with physically-informed feature extraction.
Chicago Style (17th ed.) CitationZhang, Jianyu. Enhanced Semi-supervised Stamping Process Monitoring with Physically-informed Feature Extraction. 2025.
MLA (9th ed.) CitationZhang, Jianyu. Enhanced Semi-supervised Stamping Process Monitoring with Physically-informed Feature Extraction. 2025.
Warning: These citations may not always be 100% accurate.