Microwave-field quantum metrology with inherent robustness against detection losses enabled by Rydberg interactions

Fuente: arXiv
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Bibliographic Details
Main Authors: Kurzyna, Stanisław, Niewelt, Bartosz, Mazelanik, Mateusz, Wasilewski, Wojciech, Demkowicz-Dobrzański, Rafał, Parniak, Michał
Format: Preprint
Published: 2025
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