Enhancing atomic-resolution in electron microscopy: A frequency-domain deep learning denoiser

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pinto-Huguet, Ivan, Botifoll, Marc, Chen, Xuli, Eriksen, Martin Borstad, Yu, Jing, Isella, Giovanni, Cabot, Andreu, Merino, Gonzalo, Arbiol, Jordi
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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