Analysis of a 3D Integrated Superconducting Quantum Chip Structure

Fuente: arXiv
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Autores principales: Saslow, James, Wong, Hiu Yung
Formato: Preprint
Publicado: 2025
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_version_ 1866914231864000512
author Saslow, James
Wong, Hiu Yung
author_facet Saslow, James
Wong, Hiu Yung
contents This work presents a combined analytical and simulation-based study of a 3D-integrated quantum chip architecture. We model a flip-chip-inspired structure by stacking two superconducting qubits fabricated on separate high-resistivity silicon substrates through a dielectric interlayer. Utilizing \emph{rigorous} Ansys High-Frequency Structure Simulator (HFSS) simulations and analytical models from microwave engineering and quantum theory, we evaluate key quantum metrics such as eigenfrequencies, Q-factors, decoherence times, anharmonicity, cross-Kerr, participation ratios, and qubit coupling energy to describe the performance of the quantum device as a function of integration parameters. The integration parameters include the thickness and the quality of the dielectric interlayer. For detuned qubits, these metrics remain mostly invariant with respect to the substrate separation. However, introducing dielectric interlayer loss decreases the qubit quality factor, which consequentially degrades the relaxation time of the qubit. It is found that for the structure studied in this work, the stacked chip distance can be as small as $0.5 \text{mm}$. These findings support the viability of 3D quantum integration as a scalable alternative to planar architectures, while identifying key limitations in qubit coherence preservation due to lossy interlayer materials.
format Preprint
id arxiv_https___arxiv_org_abs_2505_02263
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Analysis of a 3D Integrated Superconducting Quantum Chip Structure
Saslow, James
Wong, Hiu Yung
Quantum Physics
This work presents a combined analytical and simulation-based study of a 3D-integrated quantum chip architecture. We model a flip-chip-inspired structure by stacking two superconducting qubits fabricated on separate high-resistivity silicon substrates through a dielectric interlayer. Utilizing \emph{rigorous} Ansys High-Frequency Structure Simulator (HFSS) simulations and analytical models from microwave engineering and quantum theory, we evaluate key quantum metrics such as eigenfrequencies, Q-factors, decoherence times, anharmonicity, cross-Kerr, participation ratios, and qubit coupling energy to describe the performance of the quantum device as a function of integration parameters. The integration parameters include the thickness and the quality of the dielectric interlayer. For detuned qubits, these metrics remain mostly invariant with respect to the substrate separation. However, introducing dielectric interlayer loss decreases the qubit quality factor, which consequentially degrades the relaxation time of the qubit. It is found that for the structure studied in this work, the stacked chip distance can be as small as $0.5 \text{mm}$. These findings support the viability of 3D quantum integration as a scalable alternative to planar architectures, while identifying key limitations in qubit coherence preservation due to lossy interlayer materials.
title Analysis of a 3D Integrated Superconducting Quantum Chip Structure
topic Quantum Physics
url https://arxiv.org/abs/2505.02263