Characterisation of Crystalline Defects in 4H Silicon Carbide using DLTS and TSC

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sorgenfrei, Niels, Arnqvist, Elias, Gurimskaya, Yana, Moll, Michael, Parzefall, Ulrich, Rizwan, Faiza, Wiehe, Moritz
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2505.02671