Yoon, G., & Lee, E. (2025). Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments.
Chicago Style (17th ed.) CitationYoon, Gangho, and Eunseok Lee. Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments. 2025.
MLA (9th ed.) CitationYoon, Gangho, and Eunseok Lee. Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments. 2025.
Warning: These citations may not always be 100% accurate.