APA (7th ed.) Citation

Yoon, G., & Lee, E. (2025). Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments.

Chicago Style (17th ed.) Citation

Yoon, Gangho, and Eunseok Lee. Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments. 2025.

MLA (9th ed.) Citation

Yoon, Gangho, and Eunseok Lee. Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments. 2025.

Warning: These citations may not always be 100% accurate.