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Mitigating parasitic contributions in measured piezoresponse for accurate determination of piezoelectric coefficients in Sc-alloyed-AlN thin films using piezo-response force microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Singh, Ch Kishan, Rajalakshmi, K., Balamurugan, N., kumar, Rakesh, Gupta, Mukul, Ramaseshan, R., Baraik, Kiran
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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