Kogileru, S., McBride, M., Bi, Y., & Ng, K. Y. (2025). Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing.
Chicago Style (17th ed.) CitationKogileru, Shruthi, Mark McBride, Yaxin Bi, and Kok Yew Ng. Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing. 2025.
MLA (9th ed.) CitationKogileru, Shruthi, et al. Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing. 2025.
Warning: These citations may not always be 100% accurate.