A Powerful Chi-Square Specification Test with Support Vectors

Fuente: arXiv
Salvato in:
Dettagli Bibliografici
Autori principali: Li, Yuhao, Song, Xiaojun
Natura: Preprint
Pubblicazione: 2025
Soggetti:
Accesso online:
Tags: Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
_version_ 1866908352969179136
author Li, Yuhao
Song, Xiaojun
author_facet Li, Yuhao
Song, Xiaojun
contents Specification tests, such as Integrated Conditional Moment (ICM) and Kernel Conditional Moment (KCM) tests, are crucial for model validation but often lack power in finite samples. This paper proposes a novel framework to enhance specification test performance using Support Vector Machines (SVMs) for direction learning. We introduce two alternative SVM-based approaches: one maximizes the discrepancy between nonparametric and parametric classes, while the other maximizes the separation between residuals and the origin. Both approaches lead to a $t$-type test statistic that converges to a standard chi-square distribution under the null hypothesis. Our method is computationally efficient and capable of detecting any arbitrary alternative. Simulation studies demonstrate its superior performance compared to existing methods, particularly in large-dimensional settings.
format Preprint
id arxiv_https___arxiv_org_abs_2505_04414
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle A Powerful Chi-Square Specification Test with Support Vectors
Li, Yuhao
Song, Xiaojun
Econometrics
Specification tests, such as Integrated Conditional Moment (ICM) and Kernel Conditional Moment (KCM) tests, are crucial for model validation but often lack power in finite samples. This paper proposes a novel framework to enhance specification test performance using Support Vector Machines (SVMs) for direction learning. We introduce two alternative SVM-based approaches: one maximizes the discrepancy between nonparametric and parametric classes, while the other maximizes the separation between residuals and the origin. Both approaches lead to a $t$-type test statistic that converges to a standard chi-square distribution under the null hypothesis. Our method is computationally efficient and capable of detecting any arbitrary alternative. Simulation studies demonstrate its superior performance compared to existing methods, particularly in large-dimensional settings.
title A Powerful Chi-Square Specification Test with Support Vectors
topic Econometrics
url https://arxiv.org/abs/2505.04414