APA (7th ed.) Citation

Sung, G. (2025). Advanced 3D Imaging Approach to TSV/TGV Metrology and Inspection Using Only Optical Microscopy.

Chicago Style (17th ed.) Citation

Sung, Gugeong. Advanced 3D Imaging Approach to TSV/TGV Metrology and Inspection Using Only Optical Microscopy. 2025.

MLA (9th ed.) Citation

Sung, Gugeong. Advanced 3D Imaging Approach to TSV/TGV Metrology and Inspection Using Only Optical Microscopy. 2025.

Warning: These citations may not always be 100% accurate.