Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction
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arXiv
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| Main Authors: | , , , , , , |
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| Format: | Preprint |
| Published: |
2025
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| _version_ | 1866918128770875392 |
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| author | Agarwal, Navya Sonal Schneider, Jan Philipp Gandikota, Kanchana Vaishnavi Kazim, Syed Muhammad Meshreki, John Ihrke, Ivo Moeller, Michael |
| author_facet | Agarwal, Navya Sonal Schneider, Jan Philipp Gandikota, Kanchana Vaishnavi Kazim, Syed Muhammad Meshreki, John Ihrke, Ivo Moeller, Michael |
| contents | The computational imaging technique of Fourier Ptychographic Microscopy (FPM) enables high-resolution imaging with a wide field of view and can serve as an extremely valuable tool, e.g. in the classification of cells in medical applications. However, reconstructing a high-resolution image from tens or even hundreds of measurements is computationally expensive, particularly for a wide field of view. Therefore, in this paper, we investigate the idea of classifying the image content in the FPM measurements directly without performing a reconstruction step first. We show that Convolutional Neural Networks (CNN) can extract meaningful information from measurement sequences, significantly outperforming the classification on a single band-limited image (up to 12 %) while being significantly more efficient than a reconstruction of a high-resolution image. Furthermore, we demonstrate that a learned multiplexing of several raw measurements allows maintaining the classification accuracy while reducing the amount of data (and consequently also the acquisition time) significantly. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2505_05054 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction Agarwal, Navya Sonal Schneider, Jan Philipp Gandikota, Kanchana Vaishnavi Kazim, Syed Muhammad Meshreki, John Ihrke, Ivo Moeller, Michael Image and Video Processing Artificial Intelligence Computer Vision and Pattern Recognition The computational imaging technique of Fourier Ptychographic Microscopy (FPM) enables high-resolution imaging with a wide field of view and can serve as an extremely valuable tool, e.g. in the classification of cells in medical applications. However, reconstructing a high-resolution image from tens or even hundreds of measurements is computationally expensive, particularly for a wide field of view. Therefore, in this paper, we investigate the idea of classifying the image content in the FPM measurements directly without performing a reconstruction step first. We show that Convolutional Neural Networks (CNN) can extract meaningful information from measurement sequences, significantly outperforming the classification on a single band-limited image (up to 12 %) while being significantly more efficient than a reconstruction of a high-resolution image. Furthermore, we demonstrate that a learned multiplexing of several raw measurements allows maintaining the classification accuracy while reducing the amount of data (and consequently also the acquisition time) significantly. |
| title | Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction |
| topic | Image and Video Processing Artificial Intelligence Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2505.05054 |