Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction

Fuente: arXiv
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Bibliographic Details
Main Authors: Agarwal, Navya Sonal, Schneider, Jan Philipp, Gandikota, Kanchana Vaishnavi, Kazim, Syed Muhammad, Meshreki, John, Ihrke, Ivo, Moeller, Michael
Format: Preprint
Published: 2025
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