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Further Characterisation of Digital Pixel Test Structures Implemented in a 65 nm CMOS Process

Fuente: arXiv
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Bibliographic Details
Main Authors: Rinella, Gianluca Aglieri, Apadula, Nicole, Andronic, Anton, Antonelli, Matias, Aresti, Mauro, Baccomi, Roberto, Becht, Pascal, Beole, Stefania, Borri, Marcello, Braach, Justus, Buckland, Matthew Daniel, Buschmann, Eric, Camerini, Paolo, Carnesecchi, Francesca, Cecconi, Leonardo, Charbon, Edoardo, Contin, Giacomo, Dannheim, Dominik, de Melo, Joao, Deng, Wenjing, di Mauro, Antonello, Hasenbichler, Jan, Hillemanns, Hartmut, Hong, Geun Hee, Isakov, Artem, Jang, Hangil, Junique, Antoine, Kim, Minjung, Kluge, Alex, Kotliarov, Artem, Křížek, Filip, Lautner, Lukas, Lim, Sanghoon, Mager, Magnus, Marras, Davide, Martinengo, Paolo, Masciocchi, Silvia, Menzel, Marius Wilm, Munker, Magdalena, Piro, Francesco, Rachevski, Alexandre, Rebane, Karoliina, Reidt, Felix, Russo, Roberto, Sanna, Isabella, Sarritzu, Valerio, Senyukov, Serhiy, Snoeys, Walter, Sonneveld, Jory, Šuljić, Miljenko, Svihra, Peter, Tiltmann, Nicolas, Di Trapani, Vittorio, Usai, Gianluca, Van Beelen, Jacob Bastiaan, Vassilev, Mirella Dimitrova, Vernieri, Caterina, Villani, Anna
Format: Preprint
Published: 2025
Subjects:
Instrumentation and Detectors
Online Access:
Acceder al recurso
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