Luminescent Platform for Thermal Sensing and Imaging Based on Structural Phase-Transition
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arXiv
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| Auteurs principaux: | , , , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866916728773017600 |
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| author | Javaid, Anam Szymczak, Maja Kubicka, Malgorzata Kinzhybalo, Vasyl Drozd, Marek Szymanski, Damian Marciniak, Lukasz |
| author_facet | Javaid, Anam Szymczak, Maja Kubicka, Malgorzata Kinzhybalo, Vasyl Drozd, Marek Szymanski, Damian Marciniak, Lukasz |
| contents | The remarkable sensitivity of the luminescent properties of Eu3+ ions to structural changes in host materials has been well-explored for years. However, the application of this feature of Eu3+ in materials exhibiting thermally induced structural phase transitions for the development of luminescent thermometers has only recently been proposed. The narrow operating range of such thermometers necessitates the exploration of new host materials. In response to this demand, this study carefully analyzes the spectroscopic properties of X as a function of temperature and dopant ion concentration. As demonstrated, X undergoes a phase transition from a low-temperature monoclinic phase to a high-temperature trigonal structure, resulting in significant changes in both the emission spectrum shape of Eu ions and the depopulation kinetics of the 5D0 level. Consequently, X can be utilized as both a ratiometric and a lifetime-based luminescence thermometer, achieving maximal relative sensitivities of 3.4 and 1.0 or the respective approaches. Additionally, this work highlights how increasing the concentration of Eu3+ ions enables the tuning of the thermal operating range to achieve optimal thermometric performance. Moreover, an implementation of ratiometric approach of temperature sensing and imaging with X using digital camera without filters was demonstrated. This is the first report that demonstrates thermal imaging using Eu3+-solely doped phosphor. This finding underscores the potential of X as a versatile host material for advanced luminescent thermometry applications. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2505_05953 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Luminescent Platform for Thermal Sensing and Imaging Based on Structural Phase-Transition Javaid, Anam Szymczak, Maja Kubicka, Malgorzata Kinzhybalo, Vasyl Drozd, Marek Szymanski, Damian Marciniak, Lukasz Materials Science The remarkable sensitivity of the luminescent properties of Eu3+ ions to structural changes in host materials has been well-explored for years. However, the application of this feature of Eu3+ in materials exhibiting thermally induced structural phase transitions for the development of luminescent thermometers has only recently been proposed. The narrow operating range of such thermometers necessitates the exploration of new host materials. In response to this demand, this study carefully analyzes the spectroscopic properties of X as a function of temperature and dopant ion concentration. As demonstrated, X undergoes a phase transition from a low-temperature monoclinic phase to a high-temperature trigonal structure, resulting in significant changes in both the emission spectrum shape of Eu ions and the depopulation kinetics of the 5D0 level. Consequently, X can be utilized as both a ratiometric and a lifetime-based luminescence thermometer, achieving maximal relative sensitivities of 3.4 and 1.0 or the respective approaches. Additionally, this work highlights how increasing the concentration of Eu3+ ions enables the tuning of the thermal operating range to achieve optimal thermometric performance. Moreover, an implementation of ratiometric approach of temperature sensing and imaging with X using digital camera without filters was demonstrated. This is the first report that demonstrates thermal imaging using Eu3+-solely doped phosphor. This finding underscores the potential of X as a versatile host material for advanced luminescent thermometry applications. |
| title | Luminescent Platform for Thermal Sensing and Imaging Based on Structural Phase-Transition |
| topic | Materials Science |
| url | https://arxiv.org/abs/2505.05953 |