Visualization of defect-induced interband proximity effect at the nanoscale

Fuente: arXiv
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Bibliographic Details
Main Authors: Gozlinski, Thomas, Li, Qili, Heid, Rolf, Kurnosikov, Oleg, Haas, Alexander, Nemoto, Ryohei, Yamada, Toyo Kazu, Schmalian, Joerg, Wulfhekel, Wulf
Format: Preprint
Published: 2025
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