Differentiable NMS via Sinkhorn Matching for End-to-End Fabric Defect Detection

Fuente: arXiv
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Auteurs principaux: Lu, Zhengyang, Lu, Bingjie, Wang, Weifan, Wang, Feng
Format: Preprint
Publié: 2025
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author Lu, Zhengyang
Lu, Bingjie
Wang, Weifan
Wang, Feng
author_facet Lu, Zhengyang
Lu, Bingjie
Wang, Weifan
Wang, Feng
contents Fabric defect detection confronts two fundamental challenges. First, conventional non-maximum suppression disrupts gradient flow, which hinders genuine end-to-end learning. Second, acquiring pixel-level annotations at industrial scale is prohibitively costly. Addressing these limitations, we propose a differentiable NMS framework for fabric defect detection that achieves superior localization precision through end-to-end optimization. We reformulate NMS as a differentiable bipartite matching problem solved through the Sinkhorn-Knopp algorithm, maintaining uninterrupted gradient flow throughout the network. This approach specifically targets the irregular morphologies and ambiguous boundaries of fabric defects by integrating proposal quality, feature similarity, and spatial relationships. Our entropy-constrained mask refinement mechanism further enhances localization precision through principled uncertainty modeling. Extensive experiments on the Tianchi fabric defect dataset demonstrate significant performance improvements over existing methods while maintaining real-time speeds suitable for industrial deployment. The framework exhibits remarkable adaptability across different architectures and generalizes effectively to general object detection tasks.
format Preprint
id arxiv_https___arxiv_org_abs_2505_07040
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Differentiable NMS via Sinkhorn Matching for End-to-End Fabric Defect Detection
Lu, Zhengyang
Lu, Bingjie
Wang, Weifan
Wang, Feng
Computer Vision and Pattern Recognition
Fabric defect detection confronts two fundamental challenges. First, conventional non-maximum suppression disrupts gradient flow, which hinders genuine end-to-end learning. Second, acquiring pixel-level annotations at industrial scale is prohibitively costly. Addressing these limitations, we propose a differentiable NMS framework for fabric defect detection that achieves superior localization precision through end-to-end optimization. We reformulate NMS as a differentiable bipartite matching problem solved through the Sinkhorn-Knopp algorithm, maintaining uninterrupted gradient flow throughout the network. This approach specifically targets the irregular morphologies and ambiguous boundaries of fabric defects by integrating proposal quality, feature similarity, and spatial relationships. Our entropy-constrained mask refinement mechanism further enhances localization precision through principled uncertainty modeling. Extensive experiments on the Tianchi fabric defect dataset demonstrate significant performance improvements over existing methods while maintaining real-time speeds suitable for industrial deployment. The framework exhibits remarkable adaptability across different architectures and generalizes effectively to general object detection tasks.
title Differentiable NMS via Sinkhorn Matching for End-to-End Fabric Defect Detection
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2505.07040