Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study

Fuente: arXiv

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Bibliographic Details
Main Authors:	Barusco, Manuel, Borsatti, Francesco, Khalifa, Youssef Ben, Pezze, Davide Dalle, Susto, Gian Antonio
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2505.07576