On-Device Crack Segmentation for Edge Structural Health Monitoring

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Yuxuan, Xu, Ye, Martinez-Rau, Luciano Sebastian, Vu, Quynh Nguyen Phuong, Oelmann, Bengt, Bader, Sebastian
Format:	Preprint
Published:	2025
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2505.07915